The new PointProbe®Plus (PPP) combines the well-known features of the proven PointProbe®series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
The NANOSENSORS™ PPP-CONTSCAuD is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode probes for some AFM instruments. Additionally, this probe type allows the application for lateral or friction force mode.
The probe offers unique features:
excellent tip radius of curvature
highly doped silicon to dissipate static charge
Au coating on detector side of cantilever
chemically inert
precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip
compatible with PointProbe® Plus XY-Alignment Series
A metallic layer (gold) is coated on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2 % of the cantilever length.
AFM Tip:
AFM Cantilever:
Beam
225 µm (215 - 235 µm)*
48 µm (40 - 55 µm)*
1 µm (0.1 - 2 µm)*
0.2 N/m (0.01 - 1.87 N/m)*
25 kHz (1 - 57 kHz)*
* guaranteed range This product features alignment grooves on the back side of the holder chip.