nanoandmore/HQ:DPE-XSC11/HQ:DPE-XSC11-100/Box of 100 AFM Probes,NanoAndMore,,NanoAndMore,+,,Array.Array.Array蚂蚁淘厂家直采.

产品名称：nanoandmore/HQ:DPE-XSC11/HQ:DPE-XSC11-100/Box of 100 AFM Probes

产品编号：HQ:DPE-XSC11-100

市场价：¥33415.20

场地：美国(厂家直采)

产品分类：分子类>其他分子产品>引物与探针>

联系QQ：1570468124

电话号码：4000-520-616

邮箱： info@ebiomall.com

美元价：$2520.00

品牌： NanoAndMore

公司：nanoandmore

公司分类：

商品介绍

Applications:

ConductiveAFMProbes

Description:

Probesofthe11serieshavefourdifferentcantilevers,twooneachsideoftheholderchip.Theycanbeusedinvariousapplications.

TheDPEprobeshaveaspecialstructureofconductinglayersappliedtothetipthatprovidesbettersignaltonoiseratioonthescansofelectricproperties.Thecoatingthicknessisincreased,whichgivesmorefreedomforusingthemincontactelectricalmodes.Theprobesprovidebetterperformanceandhighercontrastofelectricalsignals,whiletheABIlitytoresolvethesmallsurfacedetailsmightbereduced.TheprobescanbeusedinelectricACmodeswhenastudyoftheelectricpropertiesofasamplehashigherpriority.

TheconductingPtcoatingcoverstheentireSiliconchip,cantileversandtips.Itprovideshighconductivityandenhancesthelaserreflectivity.

AFMTip:

shape:Rotated

height:15µm(12-18µm)*

rADIus:<40=""nm="">

fullconeangle:40°

AFMCantilevers:

CantileverA

shape:Beam

length:500µm

width:30µm

thickness:2.7µm

forceconstant:0.2N/m(0.1-0.4N/m)*

resonancefrequency:15kHz(12-18kHz)*

CantileverB

shape:Beam

length:210µm

width:30µm

thickness:2.7µm

forceconstant:2.7N/m(1.1-5.6N/m)*

resonancefrequency:80kHz(60-100kHz)*

CantileverC

shape:Beam

length:150µm

width:30µm

thickness:2.7µm

forceconstant:7N/m(3-16N/m)*

resonancefrequency:155kHz(115-200kHz)*

CantileverD

shape:Beam

length:100µm

width:50µm

thickness:2.7µm

forceconstant:42N/m(17-90N/m)*

resonancefrequency:350kHz(250-465kHz)*

*typicalrange

品牌介绍

AFM 探针制造商：

如果有必要，我们是提供所有主要 AFM 探针品牌的唯一来源。除了 AFM 尖端和悬臂，NanoAndMore 还提供不同种类的扫描探针显微镜和纳米技术相关设备。

NANOSENSORS™ - 1990 年，NANOSENSORS™ 是第一家商业化制造AFM 探针的公司。NANOSENSORS™ 仍然是全球技术领先者，提供最一致的AFM 探针质量，从而确保为其客户提供最可重复的测量结果。

NANOSENSORS™ 提供最广泛的高质量标准和专业AFM 探针，以及用于扫描探针显微镜的校准标准和对准芯片。