Cantilever:
F:15kHz
C:0.2N/m
L:450µm
Applications:
ConductiveAFMProbes
Description:
NANOSENSORS™AdvancedTEC™ContPtAFMprobesaredesignedforcontactmodeimaging.Theyfeatureatetrahedraltipthatprotrudesfromtheveryendofthecantilever.
Thisuniquefeatureallowsprecisepositioningandmakesthe
AdvancedTEC™theonlyAFMscanningprobeintheworldthatoffers
REALTIPVISIBILITYFROMTOP,evenwhentheprobeistiltedduetoitsmountingontotheAFMhead.Thisfeaturemakesthemthepremiumchoiceforallapplicationswherethetiphastobeplacedexactlyonthepointofinterestand/orhastobevis
IBLe(e.g.Nanomanipulation).
Duetotheirverysmallhalfconeanglesthetipsofthe
AdvancedTEC™Seriesshowgreatperformanceonsamplesthathaveasmallpatternsizecombinedwithsteepsamplefeatures.
Theprobeoffersuniquefeatures:
- REALTIPVISIBILITYFROMTOP
- metallicconductivityofthetip
- highmechanicalQ-factorforhighsensitivity
- aspectratioofthelast1.5µmofthetip>4:1(fromfrontandside)
- tipshapeisdefinedbyrealcrystalplanesresultinginhighlyreproduciblegeometriesandextremelysmoothsurfaces
- highlydopedsinglecrystalsilicon(0.01-0.025Ohm*cm)
- rectangularcantileverwithtrapezoidalcrosssection
- holderdimensionsare1.6mmx3.4mm
Pleasenote:Wearatthetipcanoccurifoperatingincontact-,friction-orforcemodulationmodeorwhereitisnecessarytoconducthighcurrents.
ThePtIr5coatingisanapproximately25nmthickdoublelayerofchromiumandplatinumiridium5onbothsidesofthecantilever.Thetipsidecoatingenhancestheconductivityofthetipandallowselectricalcontacts.Thedetectorsidecoatingenhancesthereflectivityofthelaserbeambyafactorofabout2andpreventslightfrominterferingwithinthecantilever.Thecoatingprocessisoptimizedforstresscompensationandwearresistance.Thebendingofthecantileverduetostressislessthan3.5%ofthecantileverlength.
AFMTip:
AFMCantilever:
Beam450µm(440-460µm)*50µm(45-55µm)*2µm(1-3µm)*0.2N/m(0.02-0.75N/m)*15kHz(7-25kHz)* *guaranteedrange