Cantilever:
F:190kHz
C:48N/m
L:225µm
Applications:
HighAspectRatio(HAR)AFMProbes
Description:
NANOSENSORS™AR5-NCLAFMtipsaredesignedfornon-contactortappingmodeAFM.TheNCLprobeisdesignedforSPMsystemsrequiringaminimumcantileverlength>125µmoraresonancefrequencyoflessthan400kHz.Comparedtothehighfrequencynon-contacttypeNCHthemaximumscanningspeedisslightlyreduced.Thiscantilevertypecombineshighoperationst
ABIlitywithoutstandingsensitivityandfastscanningability.
Formeasurementsonsampleswithsidewallanglesapproaching90°
NANOSENSORS™producesspeciallytailoredtips.ThesetipsareFIB(ForcedIonBeam)milledtoachieveahighaspectratioportionbetterthan5:1attheendofthecommonsilicontip.Thissubtractivemethodofproducingthehighaspectrationeedleofferstheadvantageofhighlateralstiffnessandrigidityofthetip.
Theprobeoffersuniquefeatures:- lengthofthehighaspectratioportionofthetip>2µm
- typicalaspectratioat2µmintheorderof7:1(whenviewedfromsideaswellasalongcantileveraxis)
- excellenttiprADIusofcurvature
- monolithictip
- highlydopedsilicontodissipatestaticcharge
- highmechanicalQ-factorforhighsensitivity
- precisealignmentofthecantileverposition(within+/-2µm)whenusedwiththeAlignmentChip
- compatIBLewithPointProbe®PlusXY-AlignmentSeries
None,Aluminiumreflexcoatingondetectorsideofthecantileveravailable
AFMTip:
AFMCantilever:
Beam225µm(215-235µm)*38µm(30-45µm)*7µm(6-8µm)*48N/m(21-98N/m)*190kHz(146-236kHz)* *guaranteedrange