Cantilever:

F: 75 kHz C: 2.8 N/m L: 240 µm

Applications:

Force Modulation (FM) AFM ProbesNon-Contact / Soft Tapping Mode AFM Probes

Description:

Optimized positioning through maximized tip visibilityNanoWorld Arrow™ FM probes are designed for Force Modulation Mode imaging. The Force Constant of the FM type fills the gap between Contact and Non-Contact probes. Furthermore Non-Contact / TappingMode™ imaging is possible with this AFM probe.All SPM and AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The probes feature a rectangular cantilever with a triangular free end and a tetrahedral tip.Additionally, this probe offers an excellent tip radius of curvature.The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest.

Aluminum Reflex CoatingThe aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever.

AFM Tip:

  • shape: Arrow
  • height: 10 - 15 µm
  • radius:

    • AFM Cantilever:

  • shape: Beam
  • length: 240 µm (235 - 245 µm)*
  • width: 35 µm (30 - 40 µm)*
  • thickness: 3 µm (2.5 - 3.5 µm)*
  • force constant: 2.8 N/m (1.4 - 5.8 N/m)*
  • resonance frequency: 75 kHz (58 - 97 kHz)*
    • * typical range