Cantilever:

F: 75 kHz C: 2.8 N/m L: 225 µm

Applications:

Conductive AFM ProbesLife Science AFM ProbesFluid Tapping AFM Probes

Description:

Cantilevers of the 18 series are optimal for the Lift mode operation AFM as they provide high stability in tapping mode as well as high sensitivity to magnetic and electric forces that may be weak. These cantilevers are also used for mapping of materials properties in Force modulation mode and the true topography imaging of the soft samples.Probes with overall conductive chemically inert 30 nm Au coating with 20 nm Cr sublayer on the tip and backside of the cantilever. Resulting tip radius is below 35 nm. The coating may cause cantilever bending within 3°. Cr-Au coating is formed as a 30 nm Au film with a 20 nm Cr sublayer, which is deposited for better adhesion of Au. The coating is formed on both tipside and backside of the cantilever.

AFM Tip:

shape: Rotated

height: 15 µm (12 - 18 µm)*

radius:

full cone angle: 40°

AFM Cantilever:

shape: Beam

length: 225 µm

width: 27.5 µm

thickness: 3 µm

force constant: 2.8 N/m (1.2 - 5.5 N/m)*

resonance frequency: 75 kHz (60 - 90 kHz)*

* typical range This product features alignment grooves on the back side of the holder chip.