Cantilever:

F: 1.2 MHz C: 100 N/m L: 65 µm

Applications:

Ultra High Frequency , Ultra Short AFM CantileversUltra High Frequency AFM Probes

Description:

The 55AC series is designed for high speed AC mode imaging. The uncoated tip offers a sharp tip apex and chemical inertness. The back side aluminum coating significantly enhances the cantilever reflectivity. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the are of interest on the sample surface. 30 nm Al on the back side of the cantilever

AFM Tip:

  • shape: OPUS
  • height: 14 µm (12 - 16 µm)*
  • radius:
  • half cone angle: 0° front, 35° back, <9° side

    • AFM Cantilever:

  • shape: Beam
  • length: 65 µm (55 - 75 µm)*
  • width: 31 µm (29 - 33 µm)*
  • thickness: 3 µm (2.5 - 3.5 µm)*
  • force constant: 100 N/m (35 - 215 N/m)*
  • resonance frequency: 1200 kHz (650 - 1850 kHz)*
    • * typical range This product features alignment grooves on the back side of the holder chip.