Cantilever:

F: 70 kHz C: 2 N/m L: 240 µm

Applications:

Non-Contact / Soft Tapping Mode AFM ProbesForce Modulation (FM) AFM Probes

Description:

The 240AC series is designed for AC mode AFM imaging of soft samples. The uncoated tip offers a sharp tip apex and chemical inertness. The back side aluminum coating significantly enhances the cantilever reflectivity. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface. 30 nm Al on the back side of the cantilever

AFM Tip:

  • shape: OPUS
  • height: 14 µm (12 - 16 µm)*
  • radius:
  • half cone angle: 0° front, 35° back, <9° side

    • AFM Cantilever:

  • shape: Beam
  • length: 240 µm (230 - 250 µm)*
  • width: 40 µm (38 - 42 µm)*
  • thickness: 2.6 µm (2.1 - 3.1 µm)*
  • force constant: 2 N/m (0.6 - 3.9 N/m)*
  • resonance frequency: 70 kHz (45 - 90 kHz)*
    • * typical range This product features alignment grooves on the back side of the holder chip.